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Modular Printed Circuit Boards for Broadband Characterization of Nanoelectronic Quantum Devices
IEEE Transactions on Instrumentation and Measurement [IEEE], Volume: 65 Issue: 8 Pages: 1827-1835
Spin-dependent recombination and single charge dynamics in silicon nanostructrures
The European Physical Journal Plus [Springer Berlin Heidelberg], Volume: 129 Issue: 6 Pages: 121
Charge dynamics of a single donor coupled to a few-electron quantum dot in silicon
Applied Physics Letters [American Institute of Physics], Volume: 100 Issue: 21 Pages: 213107
Few electron limit of n-type metal oxide semiconductor single electron transistors
Nanotechnology [IOP Publishing], Volume: 23 Issue: 21 Pages: 215204
Thin solid films [Elsevier], Volume: 520 Issue: 14 Pages: 4820-4822
Thin solid films [Elsevier], Volume: 520 Issue: 14 Pages: 4617-4621
Thin solid films [Elsevier], Volume: 520 Issue: 14 Pages: 4617-4621
Spin blockade in a triple silicon quantum dot in CMOS technology
APS [], Volume: 2012 Pages: P14. 010
Adiabatic charge control in a single donor atom transistor
Applied physics letters [American Institute of Physics], Volume: 98 Issue: 5 Pages: 053109
Thermal and electrical characterization of materials for phase-change memory cells
Journal of Chemical & Engineering Data [American Chemical Society], Volume: 54 Issue: 6 Pages: 1698-1701
Atomic layer deposition of magnetic thin films
ACTA PHYSICA POLONICA SERIES A [POLISH ACADEMY OF SCIENCES WARSAW], Volume: 112 Issue: 6 Pages: 1271
Defects at the High-k/Semiconductor Inter-faces Investigated by Spin Dependent Spectroscopies
NATO Science Series [], Volume: 220 Pages: 263
DEFECTS AT THE HIGH-κ/SEMICONDUCTOR INTERFACES INVESTIGATED BY SPIN DEPENDENT SPECTROSCOPIES
Defects in High-k Gate Dielectric Stacks [Springer, Dordrecht], Pages: 263-276