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Mario Alia is a technician of process at the CNR IMM MDM Laboratory since February 2002. His main interests are: photolithography, process developing, maintenance of the various equipments and following the inherent parts to layout and lacing. His previous experiences are: s Near Corning OTI Engineer of process with projects responsibility to improve production profitability and costs, to manage problem list of layout and acquisition of clean room equipment (2000-2001) s Near Pirelli Optical Systems as responsible of the pilot line in the team of laser chip engineering (1999-2000) and responsible of the Front End area: from the wafer with epitaxial structure to the chip realization (1996-1998). He got the certification ISO 9002 for the manufacturing area of his responsibility. Near Pirelli Cable and Systems as responsible of a part of the IBM technological transfer about the “980 nm Pump Laser chip” process (1994-1995).
Scientific Production
Large Area Growth of Silver and Gold Telluride Ultrathin Films via Chemical Vapor Tellurization
Inorganics [MDPI], Volume: 12 Issue: 1 Pages: 33
Advanced Materials Interfaces [], Volume: 8 Issue: 23 Pages: 2101244
Advanced Functional Materials [Wiley-VCH], Pages: 2109361
Materials [Multidisciplinary Digital Publishing Institute], Volume: 13 Issue: 12 Pages: 2786
Engineering the Growth of MoS2 via Atomic Layer Deposition of Molybdenum Oxide Film Precursor
Advanced Electronic Materials [], Volume: 2 Issue: 10 Pages: 1600330
Nanotechnology [IOP Publishing], Volume: 27 Issue: 17 Pages: 175703
Surface & Coatings Technology [Elsevier], Volume: 280 Pages: 37–42
Thermodynamic stability of high phosphorus concentration in silicon nanostructures
Nanoscale [Royal Society of Chemistry], Volume: 7 Issue: 34 Pages: 14469-14475
Microelectronic Engineering [Elsevier], Volume: 85 Issue: 12 Pages: 2425-2429
Microelectronic Engineering [Elsevier], Volume: 85 Issue: 12 Pages: 2442-2444
Microelectronic Engineering [Elsevier], Volume: 85 Issue: 12 Pages: 2414-2419
Spectroscopic ellipsometry study of thin NiO films grown on Si (100) by atomic layer deposition
Applied Physics Letters [American Institute of Physics], Volume: 92 Issue: 22 Pages: 222907
Microwave irradiation effects on random telegraph signal in a MOSFET
Physics Letters A [North-Holland], Volume: 370 Issue: 5-6 Pages: 491-493
Vibrational and electrical properties of hexagonal La 2 O 3 films
APPLIED PHYSICS LETTERS [American Institute of Physics], Volume: 91 Issue: 102901