Christian Martella graduated in Physics at the University of Pisa in 2009 with a master thesis on the near-field optical microscopy investigation of plasmonic metal nanostructures. (Final grade: 110/110). In 2013, he obtained the Ph.D. in Nanotechnology (XXV cycles) at the University of Genova working on the optical functionalization of substrate for broad-band photonic and photovoltaic applications by means of ion-beam based nanostructuring techniques. From 2013 to 2015, he held a post-Doc fellowship at the same university. Since 2015 he is a post-Doc fellow at the CNR-IMM laboratory (Agrate-Brianza) focusing his major activity on the growth and characterization of flat and anisotropic nanosheets of transition metal dichalcogenides. During his research activity, he gained experience in the growth of thin films by means of physical and chemical vapour phase methods. His activity is also related to the structural and chemical characterization of thin films by means of X-Ray Photoelectron Spectroscopy (XPS) and optical characterization by means of far-field (transmittance, reflectance, absorbance) and Raman scattering spectroscopy in the UV-IR range. He has a solid experience of surface investigation at the nanoscale by means of scanning probe microscopy (SNOM, AFM, Kelvin Probe AFM, etc…).