Journals | Agrate UNIT

Transport characterization of silicon-YBCO buffered multilayers deposited by magnetron sputtering

Angelica Chiodoni, Carlo Camerlingo, Roberto Gerbaldo, Laura Gozzelino, Francesco Laviano, Bruno Minetti, Candido F Pirri, Giuseppe Rombolà, Grazia Tallarida, Elena Tresso, Enrica Mezzetti

2005-06-13

Biblio references: Volume: 15 Issue: 2 Pages: 3062-3065

Origin: IEEE transactions on applied superconductivity

Oxidation-enhanced diffusion of boron in very low-energy N 2+-implanted silicon

D Skarlatos, C Tsamis, M Perego, M Fanciulli

2005-06-01

Biblio references: Volume: 97 Issue: 11 Pages: 113534

Origin: Journal of applied physics

Calvarial metastases as clinical presentation of renal cell carcinoma: report of two cases and review of the literature

Paolo Gaetani, Antonio Di Ieva, Piergiuseppe Colombo, Flavio Tancioni, Enrico Aimar, Alberto Debernardi, Riccardo Rodriguez y Baena

2005-06-01

Biblio references: Volume: 107 Issue: 4 Pages: 329-333

Origin: Clinical neurology and neurosurgery

Dense arrays of Co nanocrystals epitaxially grown on ion-patterned Cu (110) substrates

Alessandro Molle, F Buatier de Mongeot, C Boragno, R Moroni, F Granone, D Sekiba, R Buzio, U Valbusa, R Felici, C Quirós

2005-04-04

Biblio references: Volume: 86 Issue: 14 Pages: 141906

Origin: Applied Physics Letters

Half-metallic Mn-doped Si (x) Ge (1− x) alloys: a first principles study

Maria Peressi, A Debernardi, S Picozzi, F Antoniella, A Continenza

2005-04-01

Biblio references: Volume: 33 Issue: 1-3 Pages: 125-131

Origin: Computational materials science

Fabrication of nanocrystal memories by ultra low energy ion implantation

Nikolay Cherkashin, Caroline Bonafos, H Coffin, Marzia Carrada, S Schamm, Gérard Ben Assayag, D Chassaing, P Dimitrakis, P Normand, M Perego, M Fanciulli, T Muller, KH Heinig, Alain Claverie

2005-04-01

Biblio references: Volume: 2 Issue: 6 Pages: 1907-1911

Origin: physica status solidi (c)

Nanoscale morphological and electrical homogeneity of HfO 2 and ZrO 2 thin films studied by conducting atomic-force microscopy

S Kremmer, H Wurmbauer, C Teichert, G Tallarida, S Spiga, C Wiemer, M Fanciulli

2005-04-01

Biblio references: Volume: 97 Issue: 7 Pages: 074315

Origin: Journal of applied physics

Temperature dependence of rippled corrugations induced on the Rh (110) surface via ion sputtering

Alessandro Molle, F Buatier de Mongeot, F Granone, R Buzio, G Firpo, C Boragno, U Valbusa

2005-04-01

Biblio references: Volume: 230 Issue: 1-4 Pages: 555-559

Origin: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Spin polarization and band alignments at NiMnSb/GaAs interface

A Debernardi, Maria Peressi, Alfonso Baldereschi

2005-04-01

Biblio references: Volume: 33 Issue: 1-3 Pages: 263-268

Origin: Computational materials science

Shallow donor electron spins as qubits in silicon: detection and manipulation

Marco Fanciulli

2005-03-01

Biblio references: Pages: X10. 005

Origin: APS March Meeting Abstracts

Transport characterization of silicon-YBCO buffered multilayers deposited by magnetron sputtering

Oxidation-enhanced diffusion of boron in very low-energy N 2+-implanted silicon

Calvarial metastases as clinical presentation of renal cell carcinoma: report of two cases and review of the literature

Dense arrays of Co nanocrystals epitaxially grown on ion-patterned Cu (110) substrates

Half-metallic Mn-doped Si (x) Ge (1− x) alloys: a first principles study

Fabrication of nanocrystal memories by ultra low energy ion implantation

Nanoscale morphological and electrical homogeneity of HfO 2 and ZrO 2 thin films studied by conducting atomic-force microscopy

Temperature dependence of rippled corrugations induced on the Rh (110) surface via ion sputtering

Spin polarization and band alignments at NiMnSb/GaAs interface

Shallow donor electron spins as qubits in silicon: detection and manipulation

Pages

Scientific Productions

Units in Italy

Contact info

Link utili

You are here

Pages

Scientific Productions

Units in Italy

Contact info

Link utili