MARCO Fanciulli, OMAR Costa, SILVIA Baldovino, SIMONE Cocco, GABRIELE Seguini, ENRICO Prati, GIOVANNA Scarel
Biblio references: Volume: 220 Pages: 263
Origin: NATO Science Series
SIMONE COCCO BALDOVINO, GABRIELE SEGUINI, ENRICO PRATI, GIOVANNA SCAREL
Biblio references: Pages: 263
Origin: Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices
A Lamperti, Paolo Maria Ossi
Biblio references: Volume: 252 Issue: 6 Pages: 2288-2296
Origin: Applied surface science
Mariano Venanzi, Giuseppina Pace, Antonio Palleschi, Lorenzo Stella, Paola Castrucci, Manuela Scarselli, Maurizio De Crescenzi, Fernando Formaggio, Claudio Toniolo, Giovanni Marletta
Biblio references: Volume: 600 Issue: 2 Pages: 409-416
Origin: Surface science
A Lamperti, PM Ossi
Biblio references: Volume: 252
Origin: Applied Surface Science
F d’Acapito, G Smolentsev, F Boscherini, M Piccin, G Bais, S Rubini, F Martelli, Alfonso Franciosi
Biblio references: Volume: 73 Issue: 3 Pages: 035314
Origin: Physical Review B
M Marangoni, Mirko Lobino, Roberta Ramponi, E Cianci, V Foglietti
Biblio references: Volume: 14 Issue: 1 Pages: 248-253
Origin: Optics express
Mirko Lobino, M Marangoni, Roberta Ramponi, E Cianci, V Foglietti, S Takekawa, M Nakamura, K Kitamura
Biblio references: Volume: 31 Issue: 1 Pages: 83-85
Origin: Optics letters
T Cesca, A Gasparotto, A Verna, B Fraboni, G Impellizzeri, F Priolo, L Tarricone, M Longo
Biblio references: Volume: 242 Issue: 1-2 Pages: 653-655
Origin: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Agostino Pirovano, Luca Perniola, Hiroshi Mizuta, Heike Riel, Damien Deleruyelle, Rainer Waser, Sidhu Maikap, Grazia Tallarida, Claudia Wiemer, Daniele Ielmini
Biblio references: Volume: 274 Issue: 5
Origin: IEDM Short Course
