Journals | Agrate UNIT

Degradation pattern of thin HfO2 films on Si (100) under ultrahigh-vacuum annealing: An investigation by x-ray photoelectron spectroscopy and low-energy ion scattering

AV Zenkevich, YY Lebedinskii, NS Barantsev, VN Nevolin, VS Kulikauskas, G Scarel, M Fanciulli

2006-07-01

Biblio references: Volume: 35 Issue: 4 Pages: 210-215

Origin: Russian Microelectronics

Static and dynamic features of a helical hexapeptide chemisorbed on a gold surface

Giuseppina Pace, Mariano Venanzi, Paola Castrucci, Manuela Scarselli, Maurizio De Crescenzi, Antonio Palleschi, Lorenzo Stella, Fernando Formaggio, Claudio Toniolo, Giovanni Marletta

2006-07-01

Biblio references: Volume: 26 Issue: 5-7 Pages: 918-923

Origin: Materials Science and Engineering: C

Observation of dynamic localization in periodically curved waveguide arrays

Stefano Longhi, M Marangoni, M Lobino, Roberta Ramponi, Paolo Laporta, E Cianci, V Foglietti

2006-06-21

Biblio references: Volume: 96 Issue: 24 Pages: 243901

Origin: Physical review letters

Surface analytical chemical imaging and morphology of Cu–Cr alloy

A Lamperti, Paolo Maria Ossi, VP Rotshtein

2006-06-20

Biblio references: Volume: 200 Issue: 22-23 Pages: 6373-6377

Origin: Surface and Coatings Technology

Nonlinear electric field effects in the magnetoresistance of n-type GaSb

C Ghezzi, R Magnanini, A Parisini, M Longo

2006-06-15

Biblio references: Volume: 99 Issue: 12 Pages: 123709

Origin: Journal of applied physics

X-ray absorption spectroscopy study of Yb 2 O 3 and Lu 2 O 3 thin films deposited on Si (100) by atomic layer deposition

M Malvestuto, G Scarel, C Wiemer, M Fanciulli, F d’Acapito, F Boscherini

2006-05-31

Biblio references: Volume: 246 Issue: 1 Pages: 90-95

Origin: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Band alignment at the La 2 Hf 2 O 7∕(001) Si interface

G Seguini, S Spiga, E Bonera, M Fanciulli, A Reyes Huamantinco, CJ Först, CR Ashman, PE Blöchl, A Dimoulas, G Mavrou

2006-05-15

Biblio references: Volume: 88 Issue: 20 Pages: 202903

Origin: Applied physics letters

Band alignment at the La {sub 2} Hf {sub 2} O {sub 7}/(001) Si interface

G Seguini, S Spiga, E Bonera, M Fanciulli, A Reyes Huamantinco, CJ Foerst, CR Ashman, PE Bloechl, A Dimoulas, G Mavrou

2006-05-15

Biblio references: Volume: 88 Issue: 20

Origin: Applied Physics Letters

X-ray absorption spectroscopy study of Yb2O3 and Lu2O3 thin films deposited on Si (1 0 0) by atomic layer deposition

M Malvestuto, G Scarel, C Wiemer, M Fanciulli, F d’Acapito, F Boscherini

2006-05-01

Biblio references: Volume: 246 Issue: 1 Pages: 90-95

Origin: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Interface sharpening in CoFeB magnetic tunnel junctions

ATG Pym, A Lamperti, BK Tanner, T Dimopoulos, M Rührig, J Wecker

2006-04-17

Biblio references: Volume: 88 Issue: 16 Pages: 162505