2007 | Agrate UNIT

Formation and dissolution of DN complexes in dilute nitrides

Marina Berti, Gabriele Bisognin, Davide De Salvador, Enrico Napolitani, Silvia Vangelista, Antonio Polimeni, Mario Capizzi, Federico Boscherini, Gianluca Ciatto, Silvia Rubini, Faustino Martelli, Alfonso Franciosi

2007-11-20

Biblio references: Volume: 76 Issue: 20 Pages: 205323

Origin: Physical Review B

Conduction band offset of Hf O 2 on GaAs

G Seguini, M Perego, S Spiga, M Fanciulli, A Dimoulas

2007-11-05

Biblio references: Volume: 91 Issue: 19 Pages: 192902

Origin: Applied Physics Letters

Microwave irradiation effects on random telegraph signal in a MOSFET

Enrico Prati, Marco Fanciulli, Alessandro Calderoni, Giorgio Ferrari, Marco Sampietro

2007-10-29

Biblio references: Volume: 370 Issue: 5-6 Pages: 491-493

Origin: Physics Letters A

Effects of the oxygen precursor on the interface between (100) Si and Hf O 2 films grown by atomic layer deposition

S Baldovino, S Spiga, G Scarel, M Fanciulli

2007-10-22

Biblio references: Volume: 91 Issue: 17 Pages: 172905

Origin: Applied Physics Letters

Epitaxial phase of hafnium dioxide for ultrascaled electronics

Alberto Debernardi, Claudia Wiemer, Marco Fanciulli

2007-10-04

Biblio references: Volume: 76 Issue: 15 Pages: 155405

Origin: Physical Review B

FAST TRACK COMMUNICATION: A criterion for entanglement in two two-level systems

E Ferraro, A Napoli, A Messina

2007-10-01

Biblio references: Volume: 40 Issue: 43 Pages: F935-F941

Origin: Journal of Physics A Mathematical General

A Morphological, Chemical and Electrical Study of HfSiON Films Properties for Interpoly Dielectric Applications in Flash Memories

Annalisa Del Vitto, Rossella Piagge, Massimo Caniatti, Claudia Wiemer, Giuseppe Pavia, Francesca Sammiceli, Enrica Ravizza, Salvatore Grasso, Simona Spadoni, Alessandro Sebastiani, Claudia Scozzari, Gabriella Ghidini, Christophe Pomarede, Jan Willem Maes, Mauro Alessandri

2007-09-28

Biblio references: Issue: 20 Pages: 1160

Origin: ECS Meeting Abstracts

A Morphological, Chemical and Electrical Study of HfSiON Films for Inter Poly Dielectric Applications in Flash Memories

Annalisa Del Vitto, Rossella Piagge, Massimo Caniatti, Claudia Wiemer, Giuseppe Pavia, Francesca Sammiceli, Enrica Ravizza, Salvatore Grasso, Simona Spadoni, Alessandro Sebastiani, Claudia Scozzari, Gabriella Ghidini, Christophe Pomarede, Jan Willem Maes, Mauro Alessandri

2007-09-28

Biblio references: Volume: 11 Issue: 4 Pages: 497

Origin: ECS Transactions

Instability of the doped high pressure rhombohedral C60 polymer structure

D Pontiroli, M Pagliari, M Belli, M Riccò, S Buga

2007-09-26

Biblio references: Volume: 446 Issue: 1 Pages: 56-58

Origin: Chemical Physics Letters

Element specific separation of bulk and interfacial magnetic hysteresis loops

AK Suszka, CJ Kinane, CH Marrows, BJ Hickey, DA Arena, J Dvorak, A Lamperti, BK Tanner, S Langridge

2007-09-24

Biblio references: Volume: 91 Issue: 13 Pages: 132510

Origin: Applied Physics Letters

Formation and dissolution of DN complexes in dilute nitrides

Conduction band offset of Hf O 2 on GaAs

Microwave irradiation effects on random telegraph signal in a MOSFET

Effects of the oxygen precursor on the interface between (100) Si and Hf O 2 films grown by atomic layer deposition

Epitaxial phase of hafnium dioxide for ultrascaled electronics

FAST TRACK COMMUNICATION: A criterion for entanglement in two two-level systems

A Morphological, Chemical and Electrical Study of HfSiON Films Properties for Interpoly Dielectric Applications in Flash Memories

A Morphological, Chemical and Electrical Study of HfSiON Films for Inter Poly Dielectric Applications in Flash Memories

Instability of the doped high pressure rhombohedral C60 polymer structure

Element specific separation of bulk and interfacial magnetic hysteresis loops

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