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Achieving the required control of dopant distribution and selectivity for nanostructured semiconducting building block is a key issue for a large variety of applications. A promising strategy is monolayer doping (MLD), which consists in the creation of a well-ordered monolayer of dopant-containing molecules bonded to the surface of the substrate. In this work, we synthesize a P δ− layer embedded in a SiO 2 matrix by MLD. Using a multi-technique approach based on time of flight secondary ion mass spectrometry (ToF-SIMS) and Rutherford backscattering spectrometry (RBS) analyses, we characterize the tuning of P dose as a function of the processing time and temperature. We found the proper conditions for a full grafting of the molecules, reaching a maximal dose of 8.3× 10 14 atoms/cm 2. Moreover, using 1D rate equation model, we model P diffusion in SiO 2 after annealing and we extract a P diffusivity in SiO 2 of …
IOP Publishing
Publication date: 
20 Jan 2016

Elisa Arduca, Massimo Mastromatteo, Davide De Salvador, Gabriele Seguini, Cristina Lenardi, Enrico Napolitani, Michele Perego

Biblio References: 
Volume: 27 Issue: 7 Pages: 075606