Skip to main content
Home
Unit
History
Where we are
Job opportunity
Training
Amministrazione trasparente
Tenders
Research Topics
Application Areas
Micro/Nano Electronics
Flexible and Large Area Electronics
Devices for Information Storage and Processing
Quantum Technologies for Communication and Information
Functional Materials and Devices
MOEMS and Multifunctional Systems
Functional Nanomaterials
Technological Areas
Synthesis and Micro/Nano Fabrication
Characterization
Modelling
Projects
Publications
Journals
Conferences
Books
Patents
PHD Thesis
People
Resource & Service
Events
Login
You are here
Home
»
Publications
»
Conferences
-
A
A
+
A
Stuck-at-OFF Fault Analysis in Memristor-Based Architecture for Synchronization
Type:
Conference
Description:
Publisher:
IEEE
Publication date:
1 Jul 2019
Authors:
Manuel Escudero, Ioannis Vourkas, Antonio Rubio
Biblio References:
Pages: 33-37
Origin:
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)
Link:
https://scholar.google.it/citations?view_op=view_citation&hl=en&citation_for_vie…
Scientific Productions
Journals
Conferences
Books
Patents
PHD-Thesis