Giovanna Scarel, Axel Svane, Marco Fanciulli
Biblio references: Pages: 1-14
Origin: Rare Earth oxide thin films
Gabriele Seguini, Michele Perego, Marco Fanciulli
Biblio references: Pages: 269-283
Origin: Rare Earth Oxide Thin Films
Biblio references:
ANDREI ZENKEVICH, YURI LEBEDINSKII, GIOVANNA SCAREL, MARCO FANCIULLI
Biblio references: Pages: 147-160
Origin: Defects in High-k Gate Dielectric Stacks
R Mantovan, C Wiemer, A Zenkevich, M Fanciulli
Biblio references: Pages: 1349-1353
Origin: ICAME 2005
Yuri Lebedinskii, Andrei Zenkevich, Giovanna Scarel, Marco Fanciulli
Biblio references: Pages: 127-142
Elena Cianci, Vittorio Foglietti, Antonio Minotti, Alessandro Caronti, Gino Caliano, Massimo Pappalardo
Biblio references: Pages: 353-382
Origin: MEMS/NEMS
MARCO FANCIULLI, OMAR COSTA, SILVIA BALDOVINO, SIMONE COCCO, GABRIELE SEGUINI, ENRICO PRATI, GIOVANNA SCAREL
Biblio references: Pages: 263-276
R Mantovan, S Spiga, M Fanciulli
Biblio references: Pages: 69-73
HP Gunnlaugsson, K Bharuth-Ram, M Dietrich, M Fanciulli, HOU Fynbo, G Weyer
Biblio references: Pages: 1315-1318
