I Sinayskiy, E Ferraro, A Napoli, A Messina, F Petruccione
Biblio references: Volume: 42 Issue: 48 Pages: 485301
Origin: Journal of Physics A: Mathematical and Theoretical
Silvia Maria Pietralunga, M Fere, M Lanata, D Piccinin, G Radnoczi, F Misjak, A Lamperti, M Martinelli, PM Ossi
Biblio references: Volume: 88 Issue: 2 Pages: 28005
Origin: EPL (Europhysics Letters)
E Ferraro, M Scala, R Migliore, A Napoli
Biblio references: Volume: 80 Issue: 4 Pages: 042112
Origin: Physical Review A
Enrico Prati, Rossella Latempa, Marco Fanciulli
Biblio references: Volume: 80 Issue: 16 Pages: 165331
Origin: Physical Review B
David Esseni, F Conzatti, M De Michielis, N Serra, Pierpaolo Palestri, Luca Selmi
Biblio references: Volume: 8 Issue: 3-4 Pages: 209
Origin: Journal of computational electronics
A Cattoni, D Petti, S Brivio, M Cantoni, R Bertacco, F Ciccacci
Biblio references: Volume: 80 Issue: 10 Pages: 104437
Sabina Spiga, Alessio Lamperti, Elena Cianci, Flavio G Volpe, Marco Fanciulli
Biblio references: Volume: 25 Issue: 6 Pages: 411
Origin: ECS Transactions
L Lamagna, C Wiemer, S Baldovino, A Molle, M Perego, Sylvie Schamm-Chardon, Pierre-Eugène Coulon, M Fanciulli
Biblio references: Volume: 95 Issue: 12 Pages: 122902
Origin: Applied Physics Letters
M Longo, A Parisini, L Tarricone, S Vantaggio, C Bocchi, F Germini, L Lazzarini
Biblio references: Volume: 311 Issue: 18 Pages: 4293-4300
Origin: Journal of crystal growth
Xavier Garros, Mikaël Casse, M Rafik, Claire Fenouillet-Béranger, Gilles Reimbold, F Martin, C Wiemer, F Boulanger
Biblio references: Volume: 49 Issue: 9-11 Pages: 982-988
Origin: Microelectronics Reliability