Alessandro Molle, Claudia Wiemer, Md Nurul Kabir Bhuiyan, Grazia Tallarida, Marco Fanciulli, Giuseppe Pavia
Biblio references: Volume: 90 Issue: 19 Pages: 193511
Origin: Applied physics letters
E Cianci, A Coppa, V Foglietti, M Dispenza, R Buttiglione, AM Fiorello, R Marcelli, S Catoni, D Pochesci
Biblio references: Volume: 84 Issue: 5-8 Pages: 1401-1404
Origin: Microelectronic engineering
E Cianci, A Coppa, V Foglietti
Biblio references: Volume: 84 Issue: 5-8 Pages: 1296-1299
A Coppa, E Cianci, V Foglietti, G Caliano, M Pappalardo
Biblio references: Volume: 84 Issue: 5-8 Pages: 1312-1315
Beatrice Fraboni, Erio Piana, Tiziana Cesca, Andrea Gasparotto, Massimo Longo, Roberto Jakomin, Luciano Tarricone
Biblio references: Volume: 90 Issue: 18 Pages: 182106
M Perego, G Scarel, M Fanciulli, IL Fedushkin, AA Skatova
Biblio references: Volume: 90 Issue: 16 Pages: 162115
F Cannone, M Collini, L D'Alfonso, G Baldini, G Chirico, G Tallarida, P Pallavicini
Biblio references: Volume: 7 Issue: 4 Pages: 1070-1075
Origin: Nano letters
T Cesca, A Verna, G Mattei, A Gasparotto, B Fraboni, G Impellizzeri, F Priolo, L Tarricone, M Longo
Biblio references: Volume: 893 Issue: 1 Pages: 241-242
Origin: AIP Conference Proceedings
M Malvestuto, M Pedio, S Nannarone, G Pavia, G Scarel, M Fanciulli, F Boscherini
Biblio references: Volume: 101 Issue: 7 Pages: 074104
Origin: Journal of applied physics
Andrei Zenkevich, Yu Lebedinskii, G Scarel, Marco Fanciulli, Andrey Baturin, N Lubovin
Biblio references: Volume: 47 Issue: 4-5 Pages: 657-659
Origin: Microelectronics Reliability
