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Three-Dimensional Analysis of Phosphorus-Doped Si Nanocrystals Embedded in SiO2 Matrix by Atom Probe Tomography

Type: 
Conference
Description: 
Publisher: 
The Japan Society of Applied Physics
Publication date: 
1 Sep 2016
Authors: 

Yasuo Shimizu, Bin Han, Gabriele Seguini, Elisa Arduca, Celia Castro, Gerard Ben Assayag, Koji Inoue, Yasuyoshi Nagai, Sylvie Schamm-Chardon, Michele Perego

Biblio References: 
Pages: 1841-1841
Origin: 
JSAP Annual Meetings Extended Abstracts The 77th JSAP Autumn Meeting 2016
Link: 
https://scholar.google.com/scholar?cluster=6174068096549710899&hl=en&oi=scholarr

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