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Cu Filament Based Resistive Switching and Oxidation Reduction through Dopamine Sensing in Novel Cu/MoS2/TinN Structure

Type: 
Conference
Description: 
Publisher: 
IEEE
Publication date: 
13 May 2018
Authors: 

Mrinmoy Dutta, Sreekanth Ginnaram, Anisha Roy, Siddheswar Maikap

Biblio References: 
Pages: 1-4
Origin: 
2018 IEEE International Memory Workshop (IMW)
Link: 
https://scholar.google.it/citations?view_op=view_citation&hl=en&citation_for_vie…

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