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Type: 
Conference
Description: 
- University of Leoben research gateway University of Leoben research gateway University of Leoben research gateway University of Leoben research gateway Research Portal frontpage banner Research Portal > Research output > Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy Menu Home Research output Profile Citation formats Persons Organisational units Activities Theses/Final papers Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy Research output: Contribution to conference › Poster › Research › peer-review Authors Harald Wurmbauer Andrei Andreev Christian Teichert And 5 others Sascha Kremmer G. Tallarida S. Spiga C. Wiemer M. Fanciulli Organisational units Institute of Physics Details Translated title of the contribution Nano-scale characterization of high-k dielectric materials by conducting atomic force , …
Publisher: 
Publication date: 
1 Jan 2006
Authors: 

Sascha Kremmer, Harald Wurmbauer, Andrei Andreev, Christian Teichert, G Tallarida, S Spiga, C Wiemer, M Fanciulli

Biblio References: 
Origin: 
14th International Winterschool on New Developments in Solid State Physics