-A A +A

Extraction of Defects Properties in Dielectric Materials From IV Curve Hysteresis

Type: 
Journal
Description: 
Publisher: 
IEEE
Publication date: 
29 Dec 2020
Authors: 

P La Torraca, F Caruso, A Padovani, S Spiga, G Tallarida, L Larcher

Biblio References: 
Volume: 42 Issue: 2 Pages: 220-223
Origin: 
IEEE Electron Device Letters
Link: 
https://scholar.google.it/citations?view_op=view_citation&hl=en&citation_for_vie…

Scientific Productions